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Proceedings Paper

Channel waveguide lasers in bulk Tm:LiYF4 crystal produced by deep diamond-saw dicing
Author(s): Pavel Loiko; Ludovic Gauthier-Manuel; Gurvan Brasse; Esrom Kifle; Lauren Guillemot; Alain Braud; Abdelmjid Benayad; Patrice Camy
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Paper Abstract

We report on a novel approach to fabricate channel (ridge) waveguides (WGs) in bulk crystals using precision diamond saw dicing. The channels feature a high depth-to-width aspect ratio (deep dicing). The proof-of-the-concept is shown for a Tm:LiYF4 fluoride crystal. Channels with a depth of 200 μm and widths of 10–50 μm are diced and characterized with a confocal laser microscopy revealing a r.m.s. roughness of the walls of about 1 μm. The passive waveguiding properties of the channels are proven at ~815 nm showing almost no leakage of the guided mode into the bulk crystal volume. The laser operation is achieved in quasi-CW regime. The maximum peak output power reaches 0.68 W at ~1.91 μm with a slope efficiency of 53.3% (in σ-polarization). The laser mode has a vertical stripe intensity profile. The proposed concept is applicable to a variety of laser crystals with different rare-earth dopants and it is promising for sensing applications.

Paper Details

Date Published: 1 April 2020
PDF: 6 pages
Proc. SPIE 11357, Fiber Lasers and Glass Photonics: Materials through Applications II, 113571L (1 April 2020); doi: 10.1117/12.2555054
Show Author Affiliations
Pavel Loiko, CIMAP, CEA-CNRS-ENSICAEN, Univ. de Caen (France)
Ludovic Gauthier-Manuel, FEMTO-ST Institute (France)
Gurvan Brasse, CIMAP, CEA-CNRS-ENSICAEN, Univ. de Caen (France)
Esrom Kifle, CIMAP, CEA-CNRS-ENSICAEN, Univ. de Caen (France)
Lauren Guillemot, CIMAP, CEA-CNRS-ENSICAEN, Univ. de Caen (France)
Alain Braud, CIMAP, CEA-CNRS-ENSICAEN, Univ. de Caen (France)
Abdelmjid Benayad, CIMAP, CEA-CNRS-ENSICAEN, Univ. de Caen (France)
Patrice Camy, CIMAP, CEA-CNRS-ENSICAEN, Univ. de Caen (France)


Published in SPIE Proceedings Vol. 11357:
Fiber Lasers and Glass Photonics: Materials through Applications II
Maurizio Ferrari; Jacob I. Mackenzie; Stefano Taccheo, Editor(s)

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