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Proceedings Paper

Port analysis using S-matrix for 2D metasurface waveguide coupler in mid-IR application
Author(s): Asif Bilal; Abdullah Nafis Khan; Osama Jalil; Shahzad Ahmad; Usman Younis; Stavros Iezekiel
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Paper Abstract

We present an intuitive method of port analysis based on an S-matrix formalism for the design of a 2D metasurface coupler integrated with strip waveguide in SOI for 3.8 μm wavelength. The metasurface design has been achieved using Lumerical by systematically optimizing the radius of circularly shaped unit cells and the period between them. The effective coupling efficiency achieved for the designed 2D metasurface integrated with waveguide is ~98% in the in-plane waveguide for the out-of-plane surface illumination. The achieved bandwidth of the structure is 1 μm. The S-parameters of the optimized design are calculated and the 3-port analysis of the device is carried out using Interconnect by Lumerical. The suggested method is general and can be applied to any multi-port devices with some simple changes made in the layout of the design. Gain is the performance metric in our case and it is defined as the ratio of power transmitted at the output port to that of power in the input port. The gain of all the three ports are calculated. We believe our design is a good alternative for conventionally employed grating couplers and inverse tapers.

Paper Details

Date Published: 2 April 2020
PDF: 6 pages
Proc. SPIE 11364, Integrated Photonics Platforms: Fundamental Research, Manufacturing and Applications, 113641D (2 April 2020); doi: 10.1117/12.2554694
Show Author Affiliations
Asif Bilal, Univ. of Cyprus (Cyprus)
Abdullah Nafis Khan, Information Technology Univ. (Pakistan)
Osama Jalil, Information Technology Univ. (Pakistan)
Shahzad Ahmad, Information Technology Univ. (Pakistan)
Usman Younis, Information Technology Univ. (Pakistan)
Stavros Iezekiel, Univ. of Cyprus (Cyprus)


Published in SPIE Proceedings Vol. 11364:
Integrated Photonics Platforms: Fundamental Research, Manufacturing and Applications
Roel G. Baets; Peter O'Brien; Laurent Vivien, Editor(s)

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