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Proceedings Paper

Defect structure of high-resistivity CdTe:Cl crystals according to the data of high-resolution x-ray diffractometry
Author(s): I. Fodchuk; A. Kuzmin; I. Hutsuliak; M. Solodkyi; V. Dovganyuk; O. Maslyanchuk; Yu. Roman; R. Zaplitnyy; O. Gudymenko; V. Kladko; V. Mоlоdkin; V. Lizunov
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Paper Abstract

The degree of structural perfection of CdTe:Cl single crystals was estimated by methods of high-resolution Xray diffractometry. Two possible systems of dislocations that consists of two sets of complete 60-degree dislocations and Frank partial dislocations were investigated with the use of Krivoglaz kinematic theory and Monte Carlo method. The density of dislocations that provides correspondence between experimental and simulated reciprocal space maps is determined.

Paper Details

Date Published: 6 February 2020
PDF: 12 pages
Proc. SPIE 11369, Fourteenth International Conference on Correlation Optics, 113691H (6 February 2020);
Show Author Affiliations
I. Fodchuk, Chernivtsi National Univ. (Ukraine)
A. Kuzmin, Chernivtsi National Univ. (Ukraine)
I. Hutsuliak, Chernivtsi National Univ. (Ukraine)
M. Solodkyi, Chernivtsi National Univ. (Ukraine)
V. Dovganyuk, Chernivtsi National Univ. (Ukraine)
O. Maslyanchuk, Chernivtsi National Univ. (Ukraine)
Yu. Roman, Chernivtsi National Univ. (Ukraine)
R. Zaplitnyy, Chernivtsi National Univ. (Ukraine)
O. Gudymenko, Institute of Semiconductor Physics of NASU (Ukraine)
V. Kladko, Institute of Semiconductor Physics of NASU (Ukraine)
V. Mоlоdkin, Institute for Metal Physics of NASU (Ukraine)
V. Lizunov, Institute for Metal Physics of NASU (Ukraine)


Published in SPIE Proceedings Vol. 11369:
Fourteenth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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