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Proceedings Paper

High-precision interference measurements of phase shift between orthogonal linear polarized beams at total internal reflection
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Paper Abstract

An interference method for measuring relative phase shift between orthogonally linearly polarized beams at total internal reflection with accuracy of 0.6 rad was proposed at this paper. We experimentally showed that it is impossible to determine the relative longitudinal displacement between beams with orthogonal linear polarizations at total internal reflection by the phase difference in the interferometer. The method developed by us could be useful in measurement of the reflected beam phase, to control the surface homogeneity, and to measure the refraction index of the prism.

Paper Details

Date Published: 6 February 2020
PDF: 6 pages
Proc. SPIE 11369, Fourteenth International Conference on Correlation Optics, 113690K (6 February 2020);
Show Author Affiliations
O. V. Angelsky, Zhejiang Univ. (China)
Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
A. Ya. Bekshaev, I. I. Mechnikov National Univ. (Ukraine)
E. I. Kurek, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
A. P. Maksimyak, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
P. P. Maksimyak, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Wenjun Yan, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 11369:
Fourteenth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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