Share Email Print

Proceedings Paper

Characterization of HOT MWIR InAs/InAsSb T2SL discrete photodetectors
Author(s): Jongwoo Kim; Henry Yuan; Andrey Rumyantsev; Phillip Bey; David Bond; Joe Kimchi; Mary Grace DeForest
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A comprehensive study of mid-wavelength infrared (MWIR) InAs/InAsSb type-II superlattice (T2SL) photodetectors was performed for full characterization of the E-O performance, reliability, and linearity as well as response speed. Teledyne Judson Technologies has recently developed high operating temperature (HOT) MWIR InAs/InAsSb T2SL large area discrete detectors of 0.25mm and 1mm for front-side illumination. The 50% cut-off wavelength of the detectors ranges from ~5.4 to ~5.7μm at room temperature. For the reliability tests, the T2SL detectors were thermally cycled and humidity tested. Initial testing data showed excellent stability to the temperature and humidity, indicating the T2SL detectors have long-term stability. Linearity, response speed and capacitance were measured at various temperatures and reverse biases. This work presents comprehensive test results, data analysis, and discussion, showing these large size, discrete T2SL detectors have the potential to replace conventional MWIR detector materials.

Paper Details

Date Published: 3 March 2020
PDF: 9 pages
Proc. SPIE 11276, Optical Components and Materials XVII, 112760J (3 March 2020); doi: 10.1117/12.2553686
Show Author Affiliations
Jongwoo Kim, Teledyne Judson Technologies (United States)
Henry Yuan, Teledyne Judson Technologies (United States)
Andrey Rumyantsev, Teledyne Judson Technologies (United States)
Phillip Bey, Teledyne Judson Technologies (United States)
David Bond, Teledyne Judson Technologies (United States)
Joe Kimchi, Teledyne Judson Technologies (United States)
Mary Grace DeForest, Teledyne Judson Technologies (United States)

Published in SPIE Proceedings Vol. 11276:
Optical Components and Materials XVII
Shibin Jiang; Michel J. F. Digonnet, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?