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Proceedings Paper

Influence of elastically-stressed state on polarization and electronic characteristics of amorphous ribbons
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Paper Abstract

Influence of elastically-stressed state on polarization and electronic parameters of Fe- and Ni- based amorphous ribbons were studied by spectroellipsometric method within the infrared hv = 0.2 – 0.6 eV. The ellipsometric parameters Δ and Ψ were measured at for azimuthal directions in own plane of the samples. It was found that dependence of dielectric function is Drude-like one within the infrared for Ni78Si8B14 ribbon. The parameters of the electronic subsystem, namely plasma frequency ωp and frequency of relaxation γ of the ribbons were found as depending on the azimuthal angle using the functions F1 – F3 based on the Drude relationship. These functions are linear dependences on the square of the frequency ω of the incident light or the light wavelength λ. It was found that plasma and relaxation frequencies decrease at two successive azimuthal rotations of the ribbon in its own plane. Consequently, the number of electrons becomes smaller, but the mobility of charge carriers increases. Such difference in the parameters behavior of the electronic subsystem indicates an induced anisotropy of the Ni78Si8B14 ribbon due to stress in its surface layer. The obtained difference in the behavior of the dependences of the real part of dielectric function ε1(Е) for both sides of the Fe77Ni1Si9B13 ribbon is explained by the specific features of the dynamic characteristics of the conduction electrons with Fermi energy.

Paper Details

Date Published: 6 February 2020
PDF: 6 pages
Proc. SPIE 11369, Fourteenth International Conference on Correlation Optics, 1136907 (6 February 2020); doi: 10.1117/12.2553469
Show Author Affiliations
Leonid V. Poperenko, Taras Shevchenko National Univ. of Kyiv (Ukraine)
Olga G. Lopatynska, Taras Shevchenko National Univ. of Kyiv (Ukraine)
Iryna V. Yurgelevych, Taras Shevchenko National Univ. of Kyiv (Ukraine)


Published in SPIE Proceedings Vol. 11369:
Fourteenth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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