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Proceedings Paper

Segmented wavefront metrology using multicolor PISTIL interferometry
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Paper Abstract

PISTIL (Piston and Tilt) is a recent interferometric system that computes the absolute piston and tip/tilt map of a segmented wavefront. Its high precision makes it usable as a metrology tool for wavefront sensing of coherently-combined laser arrays for example. This interferometer needs to correctly address high dynamic piston sensing, while dealing with fringes wrapping that leads to ambiguous phase estimations. We derived a mathematical combination for two measurements at different wavelengths and did a technical demonstration of it, using a IRIS-AO PTT111 Deformable Mirror as a segmented wavefront generator. We have verified that the loss of accuracy is slightly increased for a larger piston compared to a previous study, and we got a standard error of λ/160 with a Peak-to-valley of λ/50. This technique could be extended to a broader spectrum.

Paper Details

Date Published: 1 April 2020
PDF: 8 pages
Proc. SPIE 11352, Optics and Photonics for Advanced Dimensional Metrology, 113520V (1 April 2020); doi: 10.1117/12.2553084
Show Author Affiliations
Bastien Rouzé, ONERA (France)
Cindy Bellanger, ONERA (France)
Patrick Lanzoni, Aix-Marseille Univ., CNRS, LAM (France)
Frédéric Zamkotsian, Aix-Marseille Univ., CNRS, LAM (France)
Jérôme Primot, ONERA (France)


Published in SPIE Proceedings Vol. 11352:
Optics and Photonics for Advanced Dimensional Metrology
Peter J. de Groot; Richard K. Leach; Pascal Picart, Editor(s)

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