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Proceedings Paper

Safety verification test study based on demand analysis
Author(s): Wei Yan; Leili Hu; Shuizhong Chen; Shiyong Guo; Baolin Du; Hui Gan
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Paper Abstract

Safety test has an important impact on the suspension management system, this paper starts from the top-level requirements of the product under test, according to the functional performance characteristics of the suspension management system, to identify possible factors affecting safety, design-related tests to verify, so as to improve product safety. Based on the definition of weapon security of suspension management system, based on the existing demand analysis model and theoretical methods to extract the top requirements of suspension management system and product safety design requirements, combined with the actual project testing experience, build a suspension management system weapon security demand analysis method, Combined with specific test project analysis of the actual use scenario of the product under test, testers can use this analysis template to quickly identify the key safety-related events in the product under test, form specific test requirements and design test cases.

Paper Details

Date Published: 31 January 2020
PDF: 4 pages
Proc. SPIE 11427, Second Target Recognition and Artificial Intelligence Summit Forum, 114272Q (31 January 2020); doi: 10.1117/12.2552473
Show Author Affiliations
Wei Yan, Luoyang Electro-optical Equipment Research Institute (China)
Science and Technology on Electro-Optic Control Lab. (China)
Leili Hu, Luoyang Electro-optical Equipment Research Institute (China)
Shuizhong Chen, Luoyang Electro-optical Equipment Research Institute (China)
Shiyong Guo, Luoyang Electro-optical Equipment Research Institute (China)
Baolin Du, Luoyang Electro-optical Equipment Research Institute (China)
Hui Gan, Luoyang Electro-optical Equipment Research Institute (China)


Published in SPIE Proceedings Vol. 11427:
Second Target Recognition and Artificial Intelligence Summit Forum
Tianran Wang; Tianyou Chai; Huitao Fan; Qifeng Yu, Editor(s)

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