Share Email Print
cover

Proceedings Paper

A distributed common test platform environment
Author(s): Wei Yan; Leili Hu; Shuizhong Chen; Shiyong Guo; Baolin Du; Hui Gan
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In order to solve the inconvenience caused by the difference of hardware and software test resources during product testing, realize instrument interchange, meet the rapid change characteristics of test demand and rapid deployment requirements, this paper studies the construction method of a distributed test environment, adopts a fixed general test platform in hardware, and drives Heterogeneous hardware interface standardization technology (middleware technology), isolation module differences, to solve the different manufacturers to the module replacement to bring compatibility problems. Software adopts the design principle of layered software, connecting test elements such as device libraries, ICD libraries, use case libraries, etc. through the use case design layer, resource allocation layer, and hardware environment layer, and through XML between elements Exchange data information, interact with database information via Ethernet, and complete the automatic testing process. Each software runs independently on multiple test devices in the test environment, enabling the automatic execution of corresponding actions or automatically generating the test case software code through XML file.

Paper Details

Date Published: 31 January 2020
PDF: 4 pages
Proc. SPIE 11427, Second Target Recognition and Artificial Intelligence Summit Forum, 114272O (31 January 2020); doi: 10.1117/12.2552470
Show Author Affiliations
Wei Yan, Luoyang Electro-optical Equipment Research Institute (China)
Science and Technology on Electro-Optic Control Lab. (China)
Leili Hu, Luoyang Electro-optical Equipment Research Institute (China)
Shuizhong Chen, Luoyang Electro-optical Equipment Research Institute (China)
Shiyong Guo, Luoyang Electro-optical Equipment Research Institute (China)
Baolin Du, Luoyang Electro-optical Equipment Research Institute (China)
Hui Gan, Luoyang Electro-optical Equipment Research Institute (China)


Published in SPIE Proceedings Vol. 11427:
Second Target Recognition and Artificial Intelligence Summit Forum
Tianran Wang; Tianyou Chai; Huitao Fan; Qifeng Yu, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray