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Proceedings Paper

Near-unitary spin squeezing with ytterbium (Conference Presentation)

Paper Abstract

State of the art atomic sensors operate near the standard quantum limit (SQL) of projection noise, and overcoming this limit by using atom-atom entanglement such as spin squeezing is a major goal in quantum metrology. By coupling an ensemble of approximately 1000 Yb-171 atoms to a high-finesse asymmetric micromirror cavity with single-atom cooperativity of 1.8., we produce a near-unitary spin squeezed state. The observed spin noise suppression and metrological gain are limited by the state readout to 9.4(4) dB and 6.5(4) dB, respectively, while the generated states offer a spin noise suppression of 15.9(6) dB and a metrological gain of 12.9(6) dB over the standard quantum limit, limited by the curvature of the Bloch sphere. When requiring the squeezing process to be within 30% of unitarity, we demonstrate an interferometer that improves the averaging time over the SQL by a factor of 3.7(2).

Paper Details

Date Published: 9 March 2020
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Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112960E (9 March 2020); doi: 10.1117/12.2552065
Show Author Affiliations
Boris Braverman, Univ. of Ottawa (Canada)
Akio Kawasaki, Stanford Univ. (United States)
Edwin Pedrozo-Peñafiel, Massachusetts Institute of Technology (United States)
Simone Colombo, Massachusetts Institute of Technology (United States)
Chi Shu, Harvard Univ. (United States)
Zeyang Li, Massachusetts Institute of Technology (United States)
Enrique Mendez, Massachusetts Institute of Technology (United States)
Megan Yamoah, Massachusetts Institute of Technology (United States)
Leonardo Salvi, Univ. degli Studi di Firenze (Italy)
Daisuke Akamatsu, National Metrology Institute of Japan (Japan)
Yanhong Xiao, Fudan Univ. (China)
Vladan Vuletic, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 11296:
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
Selim M. Shahriar; Jacob Scheuer, Editor(s)

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