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Proceedings Paper

Application of complex field imaging sensor to additive manufacturing
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Paper Abstract

A phase imaging system based on complex field sensor is analyzed, and experiments are performed to verify three methods of phase retrieval, namely, multi-wavelength digital holography, multi-aperture Zernike wavefront sensing and coherent diffractive imaging. The diffracted wavefront scattered from an object (a randomly rough surface or a surface with a known feature) is captured with a CCD in the far-field and the wavefront phase at the object surface is reconstructed using an optimized iterative algorithm. Based on the method chosen, one or two diffraction patterns were captured. The results demonstrate the potential of the proposed complex field imaging sensor for in-situ quality control of additively manufactured objects.

Paper Details

Date Published: 21 February 2020
PDF: 9 pages
Proc. SPIE 11305, Ultra-High-Definition Imaging Systems III, 113050G (21 February 2020);
Show Author Affiliations
Behzad Bordbar, Univ. of Dayton (United States)
Mallik M. R. Hussain, Univ. of Dayton (United States)
Partha P. Banerjee, Univ. of Dayton (United States)


Published in SPIE Proceedings Vol. 11305:
Ultra-High-Definition Imaging Systems III
Seizo Miyata; Toyohiko Yatagai; Yasuhiro Koike, Editor(s)

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