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Proceedings Paper

Fourier ptychographic microscopy and Mueller matrix microscopy: differences and complementarity
Author(s): Anastasia Bozhok; Jean Dellinger; Yoshitate Takakura; Jihad Zallat; Christian Heinrich
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Paper Abstract

When a light wave passes through a sample, it undergoes a phase delay related to the optical path it has taken. The amount of shift is proportional to the product of the refractive index and the thickness of the sample and cannot be measured using conventional light microscopy. Furthermore, the velocity of light propagation in an optically anisotropic medium may depend on its polarization state. This causes a phase shift between the polarization components of the oscillating electric field called retardance. Both quantitative phase and polarimetric retardance are commonly used to examine biological tissues. This work investigates the complementarity of information retrieved by two optical modalities: Fourier Ptychographic Microscopy and Mueller Matrix Microscopy. We present two constructed microscopes and then compare the results obtained using histological slides for experimental validation.

Paper Details

Date Published: 30 March 2020
PDF: 9 pages
Proc. SPIE 11351, Unconventional Optical Imaging II, 1135122 (30 March 2020);
Show Author Affiliations
Anastasia Bozhok, ICube, Univ. de Strasbourg, CNRS (France)
Jean Dellinger, ICube, Univ. de Strasbourg, CNRS (France)
Yoshitate Takakura, ICube, Univ. de Strasbourg, CNRS (France)
Jihad Zallat, ICube, Univ. de Strasbourg, CNRS (France)
Christian Heinrich, ICube, Univ. de Strasbourg, CNRS (France)


Published in SPIE Proceedings Vol. 11351:
Unconventional Optical Imaging II
Corinne Fournier; Marc P. Georges; Gabriel Popescu, Editor(s)

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