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Proceedings Paper

Influence of laser acupuncture on EEG characteristics
Author(s): Anastasia I. Knyazkova; Polina V. Shulmina; Yury V. Kistenev; Аleksey А. Markelov; Maksim B. Miroshnichenko; Alexey V. Borisov
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Paper Abstract

Low-level laser exposure is a non-invasive and less painful method, which is used as an alternative method to classical acupuncture with metal needles and could be applied in clinical medical practice. The study of the laser acupuncture effect on the electroencephalogram (EEG) characteristics was carried out. The electrodes were located on the surface of the subject's head according to the standard scheme 10-20. Experimental EEG data were obtained by standard digital 16-channel electroencephalograph with EEG18 V5.0.3 software. The EEG frequencies in each of the measurements have been analyzed. This work shows that low-level laser stimulation able to change the power of rhythms in the head areas, which corresponds to the stimulation of different brain regions.

Paper Details

Date Published: 11 December 2019
PDF: 5 pages
Proc. SPIE 11322, XIV International Conference on Pulsed Lasers and Laser Applications, 113222O (11 December 2019); doi: 10.1117/12.2550757
Show Author Affiliations
Anastasia I. Knyazkova, National Research Tomsk State Univ. (Russian Federation)
Institute of Strength Physics and Materials Science (Russian Federation)
Polina V. Shulmina, Siberian State Medical Univ. (Russian Federation)
Yury V. Kistenev, National Research Tomsk State Univ. (Russian Federation)
Siberian State Medical Univ. (Russian Federation)
Аleksey А. Markelov, Institute of Strength Physics and Materials Science (Russian Federation)
Maksim B. Miroshnichenko, Institute of Strength Physics and Materials Science (Russian Federation)
Alexey V. Borisov, National Research Tomsk State Univ. (Russian Federation)
Siberian State Medical Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 11322:
XIV International Conference on Pulsed Lasers and Laser Applications
Victor F. Tarasenko; Anton V. Klimkin; Maxim V. Trigub, Editor(s)

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