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Proceedings Paper

High NA silicon metalenses for wide-field imaging (Conference Presentation)
Author(s): Thomas F. Krauss

Paper Abstract

This Conference Presentation, "High NA silicon metalenses for wide-field imaging," was recorded at Photonics West 2020 held in San Francisco, California, United States.

Paper Details

Date Published: 10 March 2020
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Proc. SPIE 11292, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XIII, 112920B (10 March 2020); doi: 10.1117/12.2550557
Show Author Affiliations
Thomas F. Krauss, Univ. of York (United Kingdom)


Published in SPIE Proceedings Vol. 11292:
Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XIII
Georg von Freymann; Eva Blasco; Debashis Chanda, Editor(s)

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