Share Email Print

Proceedings Paper

Stand-off non-destructive determination of protein level in wheat flour with a super-continuum laser
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We demonstrate an all-fiber super-continuum (SC) laser based near infrared (1160nm to 2350nm) spectroscopy system that is capable of measuring protein (gluten) levels in wheat flour, at a stand-off distance. We show that reflectance spectrum between 1160nm and 2350nm can be used to measure protein levels in wheat flour. The measured protein concentration with the partial least square regression shows a good linear correlation (R square >0.95) to the protein level measured by the Dumas method with standard error variance down to 0.5 percent. Our system could be used for non-destructive, real-time determination of the protein level of wheat flour at a stand-off distance in industrial settings such as food factories or flour milling plants.

Paper Details

Date Published: 21 February 2020
PDF: 6 pages
Proc. SPIE 11234, Optical Biopsy XVIII: Toward Real-Time Spectroscopic Imaging and Diagnosis, 112340W (21 February 2020); doi: 10.1117/12.2550400
Show Author Affiliations
Kaiwen Guo, Univ. of Michigan (United States)
Tianqu Zhai, Univ. of Michigan (United States)
Brandon Demory, Omni Sciences Inc. (United States)
Shawn Meah, Omni Sciences Inc. (United States)
Ramon Martinez, Univ. of Michigan (United States)
Mohammed N. Islam, Univ. of Michigan (United States)
Omni Science Inc. (United States)
Fred Terry, Univ. of Michigan (United States)
Robert Maynard, Omni Sciences Inc. (United States)

Published in SPIE Proceedings Vol. 11234:
Optical Biopsy XVIII: Toward Real-Time Spectroscopic Imaging and Diagnosis
Robert R. Alfano; Stavros G. Demos; Angela B. Seddon, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?