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Proceedings Paper

A fiber-based photodetector linearity measurement system from classic to single photon level
Author(s): Yike Xiao; Yangting Fu; Nan Xu; Yingwei He; Xiangliang Liu; Wende Liu; Xufeng Jing; Changyu Shen; Haiyong Gan
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Paper Abstract

It is important to measure the spectral transmission characteristics of materials when the spatial density of classical optical power (that is, the laser or attenuated light is a small spot, but the optical power hits a fixed position) is different from the spatial density of weak optical power. The most important scientific problem (research or experimental objective) is to distinguish the difference between the probability of photons passing through a sample with a specific absorption rate collectively and the probability of approaching a single photon passing through the same sample. We design an optical fiber system that can measure weak optical power. We use many methods to expand the linear measurement range so that it can measure its linearity in the power range of 1 fA-1 mA. In addition, the system can also verify the linearity of photon counter, starting from 0.1 pA block - essentially, when the detector is adjusted to 0.1 pA, the verification and evaluation of photon counting at the photomultiplier tube level is started. From the power measurement level of cryogenic radiometer to the photon counting level, the optical fiber measurement system covers 12 orders of magnitude, which also shows that the spectral transmittance and reflection ratio can cover a wide range, that is, it can be used to measure the characteristic materials with high transmittance.

Paper Details

Date Published: 12 March 2020
PDF: 7 pages
Proc. SPIE 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 114391P (12 March 2020); doi: 10.1117/12.2550289
Show Author Affiliations
Yike Xiao, China Jiliang Univ. (China)
National Institute of Metrology (China)
Yangting Fu, National Institute of Metrology (China)
Nan Xu, National Institute of Metrology (China)
Yingwei He, National Institute of Metrology (China)
Xiangliang Liu, National Institute of Metrology (China)
Wende Liu, National Institute of Metrology (China)
Xufeng Jing, China Jiliang Univ. (China)
Changyu Shen, China Jiliang Univ. (China)
Haiyong Gan, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 11439:
2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Kexin Xu; Hai Xiao; Sen Han, Editor(s)

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