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Proceedings Paper

Spectral transmittance measurement nonlinearity of a (280-540) nm spectrophotometer based on a tunable femtosecond pulse laser
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Paper Abstract

Femtosecond pulses tunable in (280-540) nm were generated via second and third harmonic generation processes from a Ti:Sapphire femtosecond laser with a 80 MHz pulse repetition rate. The temporal widths of the pulses are ~200 fs and the spectral bandwidths are <10 nm. These pulses can be used for spectral transmittance measurement using an integrating sphere photodetector with less than 0.1% fluorescence effect. The spectral transmittance measurement nonlinearity of the femtosecond pulse laser spectrophotometer was characterized using a double-path scheme for the incident power level from 1 mW to 10 μW. The nonlinearity results were compared with those obtained using a 532 nm continuous wave laser at similar power levels. The spectrophotometer can be well applied for the spectral transmittance measurement of a wide variety of neutral optical materials after nonlinearity corrections.

Paper Details

Date Published: 12 March 2020
PDF: 7 pages
Proc. SPIE 11437, 2019 International Conference on Optical Instruments and Technology: Advanced Laser Technology and Applications, 114370V (12 March 2020);
Show Author Affiliations
Yinuo Xu, China Jiliang Univ. (China)
National Institute of Metrology (China)
Yingwei He, National Institute of Metrology (China)
Houping Wu, National Institute of Metrology (China)
Weimin Wang, National Institute of Metrology (China)
Xiangliang Liu, National Institute of Metrology (China)
Yangting Fu, National Institute of Metrology (China)
Xufeng Jing, China Jiliang Univ. (China)
Haiyong Gan, National Institute of Metrology (China)

Published in SPIE Proceedings Vol. 11437:
2019 International Conference on Optical Instruments and Technology: Advanced Laser Technology and Applications
Zhiyi Wei; Chunqing Gao; Pu Wang; Franz X, Kärtner; Stefan A. Weber, Editor(s)

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