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Proceedings Paper

A transition edge sensor signal simulator to evaluate the performance of superconducting quantum interference device amplifier
Author(s): Xiangliang Liu; Haiyong Gan; Yingwei He; Yangting Fu; Nan Xu; Wende Liu; Yandong Lin
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Paper Abstract

SQUIDs can be used as amplifiers for superconducting Transition Edge Sensor (TES) photon counting detectors. According to the physical process of photon counting, a TES signal simulator was developed to evaluate the performance of SQUID amplifier for TES detectors. A triangle simulation signal was determined to be a close match to that from a real TES photon counter. The dynamic range for the output voltage versus bias current was first characterized and then the current signals were incrementally coupled to circuit to determine the highest sensitivity of a series-array SQUID amplifier. The sensitivities are obtained by changing the triangle signal amplitude added to the TES signal simulator. The impedance changes can be deduced and further obtain the temperature changes of TES devices. When knowing the photon energy, TES design parameters can be known according to the thermal characteristics. In conclusion, the TES simulator can be well applied to guide the device design for effective readout.

Paper Details

Date Published: 12 March 2020
PDF: 5 pages
Proc. SPIE 11436, 2019 International Conference on Optical Instruments and Technology: Optical Sensors and Applications, 114360V (12 March 2020); doi: 10.1117/12.2550285
Show Author Affiliations
Xiangliang Liu, National Institute of Metrology (China)
Haiyong Gan, National Institute of Metrology (China)
Yingwei He, National Institute of Metrology (China)
Yangting Fu, National Institute of Metrology (China)
Nan Xu, National Institute of Metrology (China)
Wende Liu, National Institute of Metrology (China)
Yandong Lin, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 11436:
2019 International Conference on Optical Instruments and Technology: Optical Sensors and Applications
Xuping Zhang; Hai Xiao, Editor(s)

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