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Proceedings Paper

Research on measurement optical axis eccentricity and fitting method of aspheric mirror
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Paper Abstract

A method to measurement of optical axis eccentricity and fitting about the aspheric mirror with the high-precision three-coordinate measuring machine(CMM) is presented. By establishing 2d/3d measurement coordinate system, The axis of fitting of the cylinder is selected according to the machining and assembly reference of aspheric mirror, Generating a number of concentric circles automatic measurement strategies, And make the points on each equal circumference, The probe head of the CMM is sampled on the surface of the measured aspheric mirror according to the measured strategy path to obtain the point coordinates of the distance of the reference axis, the measured surface is fitted to obtain the eccentricity of the aspheric mirror optical axis. Hyperboloid concave mirror to make use of the proposed method in the practical testing, the results show the actual processing of eccentricity is 0.0190mm, the standard deviation of 3.6×10-4mm, to meet the requirements of the design of eccentricity is less than or equal to 0.02mm.And testing the high precision centering lathe cutting machine frame fixed axis aspheric reflector components, the data indicators meet the requirements of assembly process. The accuracy of this method is high, and the traditional measuring method is easy to be affected by the precision of the tooling and easy to scratch the mirror. With large work surface, large caliber, back light weight loss (special-shaped structure) of aspheric mirrors optical axis eccentricity detection, not only suitable for different aperture aspheric mirrors the processing quality of qualified determination, but also in the machining, high precision of aspheric mirrors system with adjustable guiding role and effectively promote R-C spherical reflector optical system assembly accuracy and efficiency.

Paper Details

Date Published: 12 March 2020
PDF: 6 pages
Proc. SPIE 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 114391O (12 March 2020); doi: 10.1117/12.2550273
Show Author Affiliations
Xi hong Fu, Xi'an Institute of Optics and Precision Mechanics (China)
Shuo Li, Xi'an Institute of Optics and Precision Mechanics (China)
Li Xue, Xi'an Institute of Optics and Precision Mechanics (China)
Shi-fa Kang, Xi'an Institute of Optics and Precision Mechanics (China)
Xiang-ke Zheng, Xi'an Institute of Optics and Precision Mechanics (China)
Na-na Ma, Xi'an Institute of Optics and Precision Mechanics (China)
Qian Dang, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 11439:
2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Kexin Xu; Hai Xiao; Sen Han, Editor(s)

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