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Proceedings Paper

Based on EMCCD imaging system
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Paper Abstract

Electronic Multiplying Charge Coupled Device (EMCCD) is the focus of research and development in the field of low-light illumination. It not only has the characteristics of traditional CCD, but also has the advantages of sensitivity nest, high quantum efficiency and low noise, but The commonly used EMCCD camera is designed for only one EMCCD chip, which has low applicability and high cost. Therefore, based on the EMCCD camera's strict requirements on the phase, frequency and amplitude of the drive signal and the characteristics of the output signal, based on the in-depth analysis of the characteristics of the EMCCD camera circuit, a low-noise, real-time, stable and suitable imaging of different EMCCD chips is designed. system. Through the cameralink bus, the host computer receives and displays the EMCCD system image in real time, and can control the EMCCD drive signal amplitude, frequency, phase, matching different EMCCD chip drivers and analog-to-digital conversion requirements. In the case of different micro-illuminance, the system automatically calculates the average brightness of the current frame image. Through the "exposure function", the known current average brightness value can be used to know the relationship between the multiplication gain of the next frame image and the current gain, and calculate the gain. Adjust the value so that the next frame of image reaches the desired brightness value.

Paper Details

Date Published: 12 March 2020
PDF: 8 pages
Proc. SPIE 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 114391M (12 March 2020); doi: 10.1117/12.2550266
Show Author Affiliations
Yifan Xia, Nanjing Univ. of Science and Technology (China)
Xiaoyong Wang, Beijing Institute of Radio Metrology and Measurement (China)
Guohua Gu, Nanjing Univ. of Science and Technology (China)
Weiji He, Nanjing Univ. of Science and Technology (China)
Qian Chen, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 11439:
2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Kexin Xu; Hai Xiao; Sen Han, Editor(s)

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