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Proceedings Paper

Temperature measurements by infrared thermal imaging system in thermal vacuum test
Author(s): Yonghong Shang; Zeyuan Liu; Qinghua Gao; Xiangyu Zhao; Yabin Jian; Qiong Li
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Paper Abstract

Infrared thermal imaging technology receives infrared radiation from the measured object, and the temperature distribution will be changed into a visual image by signal processing system. In order to verify the accurate measurement, the temperature measurement experiment under vacuum environment was carried out by constructing the low temperature standard blackbody radiation source, which temperature range was from -80°C to +100°C and temperature control stability was better than ±0.05°C/30min. The general formula of the theoretic temperature of measured object surface is deduced under ultra-high vacuum and cryogenic environment, which was based on the principle of thermal radiation theory. The capability of long-wave infrared thermal imager was verified from -40°C to +60°C. The static characteristics of measurement accuracy, repeatability and linearity were analyzed, and the dynamic measurement characteristics were also tested. The results were compared with the fine thermocouple measurement data.

Paper Details

Date Published: 12 March 2020
PDF: 6 pages
Proc. SPIE 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 114391L (12 March 2020); doi: 10.1117/12.2550264
Show Author Affiliations
Yonghong Shang, Beijing Institute of Spacecraft Environment Engineering (China)
Zeyuan Liu, Beijing Institute of Spacecraft Environment Engineering (China)
Qinghua Gao, Beijing Institute of Spacecraft Environment Engineering (China)
Xiangyu Zhao, Beijing Institute of Space Mechanics and Electricity (China)
Yabin Jian, Beijing Institute of Spacecraft Environment Engineering (China)
Qiong Li, Beijing Institute of Spacecraft Environment Engineering (China)


Published in SPIE Proceedings Vol. 11439:
2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Kexin Xu; Hai Xiao; Sen Han, Editor(s)

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