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Proceedings Paper

A calibration method on 3D measurement based on structured-light with single camera
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Paper Abstract

The 3D shape measurement technology based on structured-light with a single camera has many advantageous aspects on usability, such as non-contact, high precision, high speed etc. There are various kinds of software accepting its measurement results readily. That is why it has been widely used in reality. System calibration is the key step before it begins normal scanning, and the setting of parameters in calibration directly affects the accuracy of the measurement. Some problems exist in the process of its calibration, such as the process is complicated and hard to operate, always taking low accuracy for the scanning result. This paper aims to find methods to solve the problems. The 3D scanning system used in the research is composed of a Canada-made Point Grey CMOS industrial camera (FL3-U3-13Y3M-C) with a China-made lens, a Texas instrument projector DLP LightCrafter 4500 EVM.

The parameters that can be set in the process of system calibration are discussed in the paper, and the scanning results with parameter change are evaluated based on the indicators of camera and projector’s reprojection error, scanning resolution and point cloud’s uniformity. The research concludes that the distance between the projector and the calibration board is a key factor needs to be controlled. It can be set up properly based on the indicators for the quality of scanned data, which improves the speed of system calibration and keep the collected point cloud data more stable.

Paper Details

Date Published: 12 March 2020
PDF: 10 pages
Proc. SPIE 11434, 2019 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 114341H (12 March 2020);
Show Author Affiliations
Shanshan Wang, Beijing Institute of Graphic Communication (China)
Jiong Liang, Beijing Institute of Graphic Communication (China)
Xiu Li, Beijing Institute of Graphic Communication (China)
Fan Su, Beijing Institute of Graphic Communication (China)
Zhenshan Zhao, Beijing Institute of Graphic Communication (China)


Published in SPIE Proceedings Vol. 11434:
2019 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Juan Liu; Baohua Jia; Xincheng Yao; Yongtian Wang; Takanori Nomura, Editor(s)

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