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Proceedings Paper

The research of optical fiber sensor calibration based on acoustic sensor calibration system
Author(s): Tao Zhang; Yongxia Chen; Yaoyao Cui; Yinfei Du; BeiBei Fu; Qishen Jia; Shen Gao; Yuanyao Li; Peng Wang; Hui Zheng
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Paper Abstract

In recent years, optical fiber sensing technology has been greatly developed and widely used in temperature, strain, harmonic vibration testing, especially acoustic detection based on optical fiber sensor, widely used in hydrophones, optical fiber microphones and other real-time detection and early warning systems. However, there is no good solution to the traceability problem of sensors based on optical fiber principle. In this paper, the traceability principle and process of traditional acoustic sensors are introduced in detail. Based on this opportunity, a traceability system which can be applied to optical fiber acoustic sensors is proposed. The system consists of a complete anechoic laboratory, an acoustic analyzer, an acoustic calibrator, a power amplifier, a piston generator, a sound source and microphone. The system has been successfully used to calibrate and trace the acoustic sensitivity and other parameters of the fiber acoustic sensor. The experimental results show that the scheme is effective. This paper has a certain significance for the development of optical fiber technology.

Paper Details

Date Published: 12 March 2020
PDF: 8 pages
Proc. SPIE 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 114391D (12 March 2020); doi: 10.1117/12.2549877
Show Author Affiliations
Tao Zhang, Tianjin Institute of Metrological Supervision and Testing (China)
Yongxia Chen, The Ctr. for Medical Device Evaluation of Tianjin (China)
Yaoyao Cui, Tianjin Institute of Metrological Supervision and Testing (China)
Yinfei Du, Tianjin Institute of Metrological Supervision and Testing (China)
BeiBei Fu, Tianjin Deviser Electronics Instrument Co., Ltd. (China)
Qishen Jia, Tianjin Institute of Metrological Supervision and Testing (China)
Shen Gao, Tianjin Institute of Metrological Supervision and Testing (China)
Yuanyao Li, Tianjin Institute of Metrological Supervision and Testing (China)
Peng Wang, Tianjin Institute of Metrological Supervision and Testing (China)
Hui Zheng, Tianjin Institute of Metrological Supervision and Testing (China)


Published in SPIE Proceedings Vol. 11439:
2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Kexin Xu; Hai Xiao; Sen Han, Editor(s)

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