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Proceedings Paper

Study on multi-parameter measurement of an arbitrary wave plate
Author(s): Wei Wang; Jianzhong Chen; Zhongbo Liu
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Paper Abstract

In this paper, we have developed an automated multi-parameter measuring system of arbitrary wave plate base on spectral interference theory, which can accurately extract multi-parameter of a wave plate, including the apparent retardation, absolute retardation values at a wide spectral range, the order, and the physical thickness of a wave plate. By using algorithm coded by MATLAB program, the multi-parameter of the wave plate can be automatically obtained from measured data of a double beam spectrophotometer. The theoretical analysis indicates that the proposed technique has no strict requirement for the directions of transmission axes of the polarizer and the analyzer, the fast axis of the wave plate, the retardation of the wave plate and the materials dispersion properties of the wave plate. Experimental results prove that the method has some advantages, such as high measurement accuracy, simple extraction algorithm, high data utilization, high measurement efficiency and high misalignment tolerance.

Paper Details

Date Published: 20 December 2019
PDF: 7 pages
Proc. SPIE 11209, Eleventh International Conference on Information Optics and Photonics (CIOP 2019), 112094J (20 December 2019); doi: 10.1117/12.2549870
Show Author Affiliations
Wei Wang, Shandong Jiaotong Univ. (China)
Jianzhong Chen, Shandong Jiaotong Univ. (China)
Zhongbo Liu, Shandong Jiaotong Univ. (China)


Published in SPIE Proceedings Vol. 11209:
Eleventh International Conference on Information Optics and Photonics (CIOP 2019)
Hannan Wang, Editor(s)

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