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Proceedings Paper

Dual layer x-ray detector simulation
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Paper Abstract

We report on the modeling, characterization, benchmarking, and optimization of an interventional cone beam CT system based on a dual layer X-ray detector by means of physics based simulations.

By Monte Carlo methods, we log the interaction and dose deposition (i.e. signal generation) of X-ray photons in the dual layer geometry, including scattering processes and fluorescence photon emission. From the spatial dose distribution inside the detection volume, we derive typical detector properties like X-ray spectral responses, detective quantum efficiencies 𝐷𝑄𝐸(0), and noise characteristics for particular detector layouts.

We apply these results in subsequent full system simulations to generate 3D imaging scans of dual layer spectral projections, for custom virtual phantoms containing inserts of e.g. blood sediment or iodine with different concentrations. These simulated images are used to calculate key performance indicators of the imaging system, like e.g. receiver operating characteristic based analysis of material separation capabilities.

Paper Details

Date Published: 16 March 2020
PDF: 12 pages
Proc. SPIE 11312, Medical Imaging 2020: Physics of Medical Imaging, 113121O (16 March 2020);
Show Author Affiliations
Klaus Juergen Engel, Philips Research Eindhoven (Netherlands)
Bernd Menser, Philips Research Eindhoven (Netherlands)
Pierre Rohr, Trixell (France)
Walter Ruetten, Philips Research Eindhoven (Netherlands)
Matthias Simon, Philips Research Eindhoven (Netherlands)
Axel Thran, Philips Research Hamburg (Germany)


Published in SPIE Proceedings Vol. 11312:
Medical Imaging 2020: Physics of Medical Imaging
Guang-Hong Chen; Hilde Bosmans, Editor(s)

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