In order to obtain high contrast and resolution images, in-focus ^[14] image should be collected by microscope. Though, traditional autofocusing method can determine the in-focus position, it is time consuming and requires difficult manual operations. In our previous works, we have proposed wavefront sensing based autofocusing method. Three multi-focal images are captured and the wavefront in the central position is calculated. Then, with wavefront propagation, multiple intensities at different focal planes can be computed, and the in-focus position can be determined according to the infocus criterion as Tamura coefficient. This method only needs few image recordings and is rapid, it still requires heavy computational load in wavefront propagation, limiting its application in fast conditions. In this conference paper, we improve the our previously proposed wavefront sensing based autofocusing method ^[15] using graphics processing unit ^[13], field of view reduction and down-sampling, which can efficiently accelerate the wavefront sensing based autofocusing speed. According to the advantages as fast speed, high accuracy and easy operation, the wavefront sensing based autofocusing method can be future applied in microscopy.

Date Published: 20 December 2019
PDF: 6 pages
Proc. SPIE 11209, Eleventh International Conference on Information Optics and Photonics (CIOP 2019), 112093D (20 December 2019); doi: 10.1117/12.2548832

Published in SPIE Proceedings Vol. 11209:
Eleventh International Conference on Information Optics and Photonics (CIOP 2019)
Hannan Wang, Editor(s)