
Proceedings Paper
Polarization scattering characteristics of surface micro-morphology of optical elementsFormat | Member Price | Non-Member Price |
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Paper Abstract
The scattering energy distribution described by the bidirectional reflection distribution function (BRDF) is the most basic radiation property for calculating other properties. In order to characterize the effect of the surface topography of the optical component on the scattering properties, based on the first-order perturbation theory combined with the Rayleigh scattering model, considering the specular reflection and scattering, an improved polarization bidirectional reflection distribution function(pBRDF) is proposed based on the BRDF. The influence of factors such as the surface roughness and the incident angle of irradiation on the scattering distribution and the polarization scattering distribution are discussed. A series of experimental scattering distribution curves are obtained by designing and building an experimental device based on the BRDF theory. The experimental results are in good agreement with the numerical simulation data, which demonstrates the high accuracy of the pBRDF model. Finally, the power spectral density(PSD) is inverted by scattering measurement data. The results compared with the experimental data of CCI2000, verify the correctness of the proposed model. The present research offers an objective guidance for conducting surface quality detection in the field of precision optical components processing and for ensuring the optical transmission quality of precision optical systems.
Paper Details
Date Published: 16 October 2019
PDF: 6 pages
Proc. SPIE 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019), 1120517 (16 October 2019); doi: 10.1117/12.2548424
Published in SPIE Proceedings Vol. 11205:
Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019)
Anand Asundi; Motoharu Fujigaki; Huimin Xie; Qican Zhang; Song Zhang; Jianguo Zhu; Qian Kemao, Editor(s)
PDF: 6 pages
Proc. SPIE 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019), 1120517 (16 October 2019); doi: 10.1117/12.2548424
Show Author Affiliations
Yingge Zhang, Xi'an Technological Univ. (China)
Ailing Tian, Xi'an Technological Univ. (China)
Bingcai Liu, Xi'an Technological Univ. (China)
Ailing Tian, Xi'an Technological Univ. (China)
Bingcai Liu, Xi'an Technological Univ. (China)
Weiguo Liu, Xi'an Technological Univ. (China)
Dasen Wang, Ordnance Science Institute of China (China)
Dasen Wang, Ordnance Science Institute of China (China)
Published in SPIE Proceedings Vol. 11205:
Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019)
Anand Asundi; Motoharu Fujigaki; Huimin Xie; Qican Zhang; Song Zhang; Jianguo Zhu; Qian Kemao, Editor(s)
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