Proceedings Paper
Dynamic speckle analysis with two-wavelength acquisition| Format | Member Price | Non-Member Price |
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Paper Abstract
Dynamic speckle analysis is a promising tool for inspection of speed of processes. It relies on highly sensitive of speckle phenomenon to micro-changes in the optical paths. The same phenomenon is a source of severe noise, which contaminates substantially the outcome of analysis when a pointwise processing is applied to correlated in time speckle patterns. We obtained improvement of quality of the two-dimensional activity map produced by the pointwise processing by illumination at two wavelengths in the red and green part of the spectrum and separate processing of the raw data acquired in the red and the green channels of a color camera used to capture the speckle patterns. Summation of the activity maps corresponding to the two channels results in narrower spread of fluctuations of the estimate chosen to describe the activity.
Paper Details
Date Published: 18 December 2019
PDF: 6 pages
Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 113383M (18 December 2019); doi: 10.1117/12.2548141
Published in SPIE Proceedings Vol. 11338:
AOPC 2019: Optical Sensing and Imaging Technology
John E. Greivenkamp; Jun Tanida; Yadong Jiang; HaiMei Gong; Jin Lu; Dong Liu, Editor(s)
PDF: 6 pages
Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 113383M (18 December 2019); doi: 10.1117/12.2548141
Show Author Affiliations
E. Stoykova, Institute of Optical Materials and Technologies (Bulgaria)
G. Mateev, Institute of Optical Materials and Technologies (Bulgaria)
B. Blagoeva, Institute of Optical Materials and Technologies (Bulgaria)
G. Mateev, Institute of Optical Materials and Technologies (Bulgaria)
B. Blagoeva, Institute of Optical Materials and Technologies (Bulgaria)
B. Ivanov, Institute of Optical Materials and Technologies (Bulgaria)
D. Nazarova, Institute of Optical Materials and Technologies (Bulgaria)
L. Nedelchev, Institute of Optical Materials and Technologies (Bulgaria)
D. Nazarova, Institute of Optical Materials and Technologies (Bulgaria)
L. Nedelchev, Institute of Optical Materials and Technologies (Bulgaria)
Published in SPIE Proceedings Vol. 11338:
AOPC 2019: Optical Sensing and Imaging Technology
John E. Greivenkamp; Jun Tanida; Yadong Jiang; HaiMei Gong; Jin Lu; Dong Liu, Editor(s)
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