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Proceedings Paper

Fourier ptychography: effectiveness of image classification
Author(s): Hongbo Zhang; Lin Wang; WenJing Zhou; ZhiJuan Hu; Peter W. M. Tsang; Ting-Chung Poon
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Paper Abstract

In this research, we systematically investigated the image classification accuracy of Fourier Ptychography Microscopy (FPM). Multiple linear regression of image classification accuracy (dependent variable), PSNR and SSIM (independent variables) was performed. Notebly, results show that PSNR, SSIM, and image classification accuracy has a linear relationship. It is therefore feasible to predict the image classification accuracy only based on PSNR and SSIM. It is also found that image classification accuracy of the FPM is not universally significantly differed from the lower resolution image under the higher numerical aperture (NA) condition. The difference is yet much more pronounced under the lower NA condition.

Paper Details

Date Published: 16 October 2019
PDF: 8 pages
Proc. SPIE 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019), 112050G (16 October 2019); doi: 10.1117/12.2548097
Show Author Affiliations
Hongbo Zhang, Virginia Military Institute (United States)
Lin Wang, Nanjing Univ. of Science and Technology (China)
WenJing Zhou, Shanghai Univ. (China)
ZhiJuan Hu, Shanghai Normal Univ. (China)
Peter W. M. Tsang, City Univ. of Hong Kong (China)
Ting-Chung Poon, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 11205:
Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019)
Anand Asundi; Motoharu Fujigaki; Huimin Xie; Qican Zhang; Song Zhang; Jianguo Zhu; Qian Kemao, Editor(s)

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