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Proceedings Paper

A method of measuring FP transmittance based on whispering gallery mode light source
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Paper Abstract

The Fabry-Parot etalon can be widely used in the lidar for Doppler wind measurement and aerosol detection. Due to the very wide application of the FP etalon, the standard transmission curve of the F-P is a very important parameter. The general FP etalon measures the transmittance curve by tuning the wavelength of the laser source or tuning the angle of incident light. The FP etalon generally measures the transmittance curve of the etalon by tuning the wavelength of the laser source or use the frequency comb source. Moreover, the tuning of the wavelength and the angle of incident light are nonlinear, and the measurement accuracy is insufficient, and the frequency comb source is very expensive. This paper proposes a new method for testing the transmittance curve of a FP etalon using a similar frequency comb source. The whispering gallery mode is a typical similar frequency comb laser source which has multiple frequency components, but not equal intervals. The spacing of the frequency of the whispering gallery mode is not equal, but the spacing of the frequency can be determined. So, the transmittance curve of the FP etalon can be measured at one time. And the frequency interval and spectral range are tunable easily. This new method greatly reduces the cost of measuring transmission curve, improve measurement accuracy and effectiveness and has great theoretical and practical value.

Paper Details

Date Published: 20 December 2019
PDF: 8 pages
Proc. SPIE 11209, Eleventh International Conference on Information Optics and Photonics (CIOP 2019), 1120925 (20 December 2019); doi: 10.1117/12.2548078
Show Author Affiliations
Yufei Chu, Anhui Institute of Optics and Fine Mechanics CAS (China)
Univ. of Science and Technology of China (China)
Dong Liu, Anhui Institute of Optics and Fine Mechanics CAS (China)
Univ. of Science and Technology of China (China)
Decheng Wu, Anhui Institute of Optics and Fine Mechanics CAS (China)
Univ. of Science and Technology of China (China)
Zhenzhu Wang, Anhui Institute of Optics and Fine Mechanics CAS (China)
Univ. of Science and Technology of China (China)
Qian Deng, Anhui Institute of Optics and Fine Mechanics CAS (China)
Univ. of Science and Technology of China (China)
Zhiqiang Kuang, Anhui Institute of Optics and Fine Mechanics CAS (China)
Univ. of Science and Technology of China (China)
Li Lu, Anhui Institute of Optics and Fine Mechanics CAS (China)
Univ. of Science and Technology of China (China)
Zhuang Peng, Anhui Institute of Optics and Fine Mechanics CAS (China)
Univ. of Science and Technology of China (China)
Zhiyuan Fang, Anhui Institute of Optics and Fine Mechanics CAS (China)
Univ. of Science and Technology of China (China)
Chenbo Xie, Anhui Institute of Optics and Fine Mechanics CAS (China)
Univ. of Science and Technology of China (China)
Yingjian Wang, Anhui Institute of Optics and Fine Mechanics CAS (China)
Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 11209:
Eleventh International Conference on Information Optics and Photonics (CIOP 2019)
Hannan Wang, Editor(s)

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