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Noise and linewidth characterizations of DBR laser based on surface etched high-order Bragg gratings
Author(s): Chao Chen; Peng Jia; Li Qin; Yong-Yi Chen; Hong Chen; Yong-Qiang Ning; Li-Jun Wang
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Paper Abstract

In order to obtain narrow linewidth semiconductor laser around 1564 nm, we design a distributed Bragg reflector (DBR) laser based on surface etched high-order Bragg gratings (SE-HOBGs). To achieve C-band Bragg resonance wavelength selection, the laser is designed as a grating period of 4.84 μm, an etched groove depth of 1.2 μm, a grating duty cycle of 69%, a total grating length of 72 μm, and a ridge waveguide width of 4.0 μm. For the DBR laser with cavity length of 1 mm, the output power reaches to 9.9 mW/facet and a 1564 nm laser output with a side mode suppression ratio (SMSR) more than 30 dB at an injection current of 80 mA. We measured and analyzed the phase/frequency noise, linewidth characteristics and the relative intensity noise (RIN) characteristics of the laser in detail. The lasers showed narrow Lorentz linewidth of 70 kHz. This paper provides a simple method for large-scale production of narrow linewidth semiconductor lasers.

Paper Details

Date Published: 18 December 2019
PDF: 6 pages
Proc. SPIE 11334, AOPC 2019: Optoelectronic Devices and Integration; and Terahertz Technology and Applications, 113341C (18 December 2019); doi: 10.1117/12.2548066
Show Author Affiliations
Chao Chen, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Peng Jia, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Li Qin, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Yong-Yi Chen, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Hong Chen, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Yong-Qiang Ning, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Li-Jun Wang, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 11334:
AOPC 2019: Optoelectronic Devices and Integration; and Terahertz Technology and Applications
Zhiping Zhou; Xiao-Cong Yuan; Daoxin Dai, Editor(s)

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