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Proceedings Paper

Research on calibration technology of comprehensive performance parameters of mid-far infrared space load
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Paper Abstract

Infrared imaging technology has great applications in various fields of social life, especially in the field of remote sensing. Monitoring the ground through infrared loads on satellites can explore natural resources and improve human production. However, due to limitations of equipment, space and other factors, the cost of performance calibration of space load in space is relatively high. To solve the calibration problem of spectral parameters and imaging parameters of space load in the mid-range infrared range, the parameter calibration technique is studied. The mid-far infrared space load comprehensive performance parameter calibration test system is designed by simulating the space vacuum environment on the ground, and the mid-far infrared space load can be tested in an all-round way before going into the space. The test system consists of a vacuum chamber, an infrared collimation system, a medium-far infrared monochromatic source, a standard surface source differential black body, and a series of standard targets. It can realize comprehensive calibration of spectral parameters and imaging parameters on the same device. The load to be tested is placed in a vacuum chamber to simulate a space vacuum environment. The radiation source is radiated into the vacuum chamber through an optical window to simulate ground radiation, which can achieve relative spectral responsivity, MRTD, NETD, MTF, field of view, and magnification, distortion and other parameters of the test, and achieved good experimental results. The results show that the test system can realize the calibration of the spectral parameters and imaging parameters of the mid-far infrared spatial load.

Paper Details

Date Published: 12 March 2020
PDF: 7 pages
Proc. SPIE 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 1143915 (12 March 2020); doi: 10.1117/12.2547976
Show Author Affiliations
Weigang Rong, Nanjing Univ. of Science and Technology (China)
Wenwen Zhang, Nanjing Univ. of Science and Technology (China)
Weiji He, Nanjing Univ. of Science and Technology (China)
Qian Chen, Nanjing Univ. of Science and Technology (China)
Guohua Gu, Nanjing Univ. of Science and Technology (China)
Chao Qiu, Beijing Zhenxing Institute of Metrology and Measurement (China)
Wanglin Yang, Beijing Zhenxing Institute of Metrology and Measurement (China)


Published in SPIE Proceedings Vol. 11439:
2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Kexin Xu; Hai Xiao; Sen Han, Editor(s)

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