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Proceedings Paper

An in-situ millimeter-wave diagnostic for droplet characterization during jetting-based additive manufacturing processes
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Paper Abstract

Additive manufacturing systems are becoming progressively more capable of printing geometrically complex structures from a wide range of materials. To ensure the print quality of these materials over the duration of the build process, there is a need for in-situ diagnostics which can provide real-time information during fabrication, as well as information that can be processed after print completion. Here we present an in-situ radio frequency diagnostic for liquid metal jetting, which employs a millimeter-wave waveguide device to monitor the impedance changes caused by moving droplets. Experimental results indicate promise for the characterization of size, timing, and motion of metal droplets in an advanced manufacturing system.

Paper Details

Date Published: 22 April 2020
PDF: 6 pages
Proc. SPIE 11380, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XIV, 1138008 (22 April 2020); doi: 10.1117/12.2547937
Show Author Affiliations
Tammy Chang, Lawrence Livermore National Lab. (United States)
Owen Mays, Lawrence Livermore National Lab. (United States)
Saptarshi Mukherjee, Lawrence Livermore National Lab. (United States)
Nicholas Watkins, Lawrence Livermore National Lab. (United States)
Andrew Pascall, Lawrence Livermore National Lab. (United States)
Jason Jeffries, Lawrence Livermore National Lab. (United States)
Joseph Tringe, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 11380:
Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XIV
Tzu-Yang Yu, Editor(s)

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