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Proceedings Paper

Low cutoff G.657-compatible fiber for data center interconnects operating in the 1064 and 1310 nm windows
Author(s): Scott R. Bickham; Pushkar Tandon; Snigdharaj K. Mishra; Ming-Jun Li; Ewa Simpanen; Tamás Lengyel; Johan S. Gustavsson; Anders Larsson
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Paper Abstract

Optical interconnects in data centers have traditionally used 850 nm GaAs-based vertical-cavity surface-emitting lasers (VCSELs) in combination with multimode fiber, having a reach up to 100 m in length. Longer links typically use standard single-mode fiber in conjunction with either InP-based edge-emitting lasers or silicon photonic transmitters operating in the 1310 nm or 1550 nm window. Single-mode GaAs-based VCSELs operating at 1064 nm offer another path for achieving longer system reach. Potential advantages of these VCSELs include better power efficiency, modulation speeds reaching 50 Gbps and large-scale fabrication volumes. The longer wavelength is also beneficial due to the lower attenuation and chromatic dispersion of optical fibers at that wavelength. However, one practical issue for single-mode transmission is that the G.657 standard for single-mode fiber requires that the 22-meter cable cutoff wavelength be less than 1260 nm, and these fibers are typically few-moded at 1064 nm. The large differences between the group velocities of the LP01 and LP11 modes can lead to degradation of the system performance due to multi-path interference if the higher order modes are present. To resolve this quandary, we have designed and validated the performance of a new optical fiber which is single-moded at wavelengths less than 1064 nm, but also has G.657- compliant mode field diameter and dispersion characteristics that enable it to be used in the 1310 nm window.

Paper Details

Date Published: 28 February 2020
PDF: 8 pages
Proc. SPIE 11286, Optical Interconnects XX, 112860C (28 February 2020); doi: 10.1117/12.2547869
Show Author Affiliations
Scott R. Bickham, Corning Research and Development Corp. (United States)
Pushkar Tandon, Corning Research and Development Corp. (United States)
Snigdharaj K. Mishra, Corning Optical Fiber and Cable (United States)
Ming-Jun Li, Corning Research and Development Corp. (United States)
Ewa Simpanen, Chalmers Univ. of Technology (Sweden)
Tamás Lengyel, Chalmers Univ. of Technology (Sweden)
Johan S. Gustavsson, Chalmers Univ. of Technology (Sweden)
Anders Larsson, Chalmers Univ. of Technology (Sweden)


Published in SPIE Proceedings Vol. 11286:
Optical Interconnects XX
Henning Schröder; Ray T. Chen, Editor(s)

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