Share Email Print
cover

Proceedings Paper

Dynamic speckle analysis at low contrast of recorded patterns
Author(s): Elena Stoykova; Dimana Nazarova; Kwan-Jung Oh; Joongki Park
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Dynamic speckle analysis is a highly sensitive approach for monitoring speed of processes, which cause change in micro-topography of the surface of 3D objects. The raw data are speckle patterns formed on the surface under laser light illumination. Statistical pointwise processing of correlated in time speckle patterns yields a 2D map of the ongoing activity, that shows regions of faster or slower fluctuations of laser light intensity. The map is a distribution of a given estimate, which is contaminated by signal-dependent noise due to averaging over a finite number of speckle patterns. For this reason, efficiency of processing is frequently addressed topic. This paper studies the impact of the speckle contrast on quality of the activity map characterized by the spread of the probability density function of the activity estimate. It has been shown by simulation and experiment that retrieval of different activity regions is effective at low contrast of the speckle patterns.

Paper Details

Date Published: 18 December 2019
PDF: 7 pages
Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 1133830 (18 December 2019); doi: 10.1117/12.2547859
Show Author Affiliations
Elena Stoykova, Institute of Optical Materials and Technologies (Bulgaria)
Dimana Nazarova, Institute of Optical Materials and Technologies (Bulgaria)
Kwan-Jung Oh, Electronics and Telecommunications Research Institute (Korea, Republic of)
Joongki Park, Electronics and Telecommunications Research Institute (Korea, Republic of)


Published in SPIE Proceedings Vol. 11338:
AOPC 2019: Optical Sensing and Imaging Technology
John E. Greivenkamp; Jun Tanida; Yadong Jiang; HaiMei Gong; Jin Lu; Dong Liu, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray