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Electric field distribution modelling of the distributing system 5-beam APAR in time area
Author(s): Konstantin N. Klimov; Mihail S. Matsayan; Kirill I. Konov; Irina K. Epaneshnikova; Sergey V. Serebryannikov; Sergej S. Serebryannikov; Andrey M. Belevtsev; Anton S. Boldyreff
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Paper Abstract

The 2D electromagnetic modeling distribution of electric fields for stationary and non-stationary scattering process in the time domain mode was developed. The distributing system of the optical type was expressed. Given system allows to form 5-beam directional pattern (DP) for receiving active phased antenna radar (APAR).

At reduction of the sizes of the distributing system, distance between its output reduce in once, in contrast with distance between radiators APAR. In such event corner deflections of the ray in DP APAR will corner of the deflection less in distributing system in n once also. For considered systems reduction factor of the geometric sizes n has formed the order 7. In corresponding to number once and was increased a corner of the deflection of the ray α in distributing system.

Paper Details

Date Published: 16 October 2019
PDF: 10 pages
Proc. SPIE 11163, Emerging Imaging and Sensing Technologies for Security and Defence IV, 111630N (16 October 2019); doi: 10.1117/12.2547829
Show Author Affiliations
Konstantin N. Klimov, Moscow Aviation Institute (Russian Federation)
Mihail S. Matsayan, Moscow Aviation Institute (Russian Federation)
Kirill I. Konov, National Research Univ. Higher School of Economics (Russian Federation)
Irina K. Epaneshnikova, Moscow Aviation Institute (Russian Federation)
Sergey V. Serebryannikov, National Research Univ. "MPEI" (Russian Federation)
Sergej S. Serebryannikov, National Research Univ. "MPEI" (Russian Federation)
Andrey M. Belevtsev, Moscow Aviation Institute (Russian Federation)
Anton S. Boldyreff, Southern Federal Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 11163:
Emerging Imaging and Sensing Technologies for Security and Defence IV
Gerald S. Buller; Richard C. Hollins; Robert A. Lamb; Martin Laurenzis, Editor(s)

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