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Proceedings Paper

Design of imaging evaluation system for infrared thermal imager
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Paper Abstract

Infrared thermal imager has developed rapidly in the field of military and civilian applications. How to objectively evaluate the imaging effect of the infrared thermal imager has become a problem that must be solved. Which not only provides quantitative mathematical description for the imaging performance of the infrared thermal imager, but also provides the supporting basis for the study of the image sharpness, target detection distance and target tracking performance of the infrared imaging system. The imaging evaluation system of thermal infrared imager proposed in this paper has the functions of infrared image data acquisition and processing. It is used to test and evaluate infrared image data in coordination with the target system of infrared imaging evaluation (composed of blackbody, radiation target console, collimating optical system and digital display precision turntable). The system has designed the main performance indexes, mathematical model and steps of image evaluation, including image non-uniformity, Signal Transfer Function (SiTF), Noise Equivalent Temperature Difference (NETD) three indicators to evaluate the noise and response characteristics of infrared thermal imager, and Angular Linearity, Target Imaging Positioning Angle Error two indicators to evaluate the image resolution characteristics of infrared thermal imager. After system testing, the performance is very superior and it becomes the necessary debugging and testing equipment in the development of infrared thermal imager.

Paper Details

Date Published: 18 December 2019
PDF: 6 pages
Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 113382P (18 December 2019); doi: 10.1117/12.2547758
Show Author Affiliations
Zhi-qiang Zhang, Tianjin Univ. (China)
Harglo Institute of Applied Laser Technology (China)
Ping Wang, Tianjin Univ. (China)
Xu-dong Yu, Harglo Institute of Applied Laser Technology (China)
Yu-mei Zhou, Harglo Institute of Applied Laser Technology (China)
Ting Li, Harglo Institute of Applied Laser Technology (China)

Published in SPIE Proceedings Vol. 11338:
AOPC 2019: Optical Sensing and Imaging Technology
John E. Greivenkamp; Jun Tanida; Yadong Jiang; HaiMei Gong; Jin Lu; Dong Liu, Editor(s)

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