Proceedings Paper
Dynamic error modeling and analysis based on angle intersection measurement system| Format | Member Price | Non-Member Price |
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Paper Abstract
The angle-based intersection measurement system is a high-precision overall measurement network based on the perspective observation in space. However, when the target is moving, the angular intersection failure will cause dynamic error to limit its application in the field of dynamic measurement. Aiming at this problem, Firstly, this paper analyze the sources of dynamic error from the principle, studies the influencing factors of system dynamic error include :the motion state of the measured object, station deployment. Secondly, constructs a mathematical model to predict the dynamic error of the measurement system. Finally, design some simulation experiments to quantify the measurement dynamic error at different measure conditions. The results show that under the measurement conditions of the measurement area is 10m x 10m x 1m, observation angle uncertainty is 2′′, the measured target moves at 0.05m/s, the average dynamic error of the measured area under the 0_4 deployment is the minimum, and value is 0.25mm.
Paper Details
Date Published: 18 December 2019
PDF: 8 pages
Proc. SPIE 11333, AOPC 2019: Advanced Laser Materials and Laser Technology, 1133316 (18 December 2019); doi: 10.1117/12.2547696
Published in SPIE Proceedings Vol. 11333:
AOPC 2019: Advanced Laser Materials and Laser Technology
Pu Zhou; Jian Zhang; Wenxue Li; Shibin Jiang; Takunori Taira, Editor(s)
PDF: 8 pages
Proc. SPIE 11333, AOPC 2019: Advanced Laser Materials and Laser Technology, 1133316 (18 December 2019); doi: 10.1117/12.2547696
Show Author Affiliations
Jun-nan Chen, Hubei Univ. of Technology (China)
Zhi Xiong, Hubei Univ. of Technology (China)
Key Lab. of Modern Manufacturing Quality Engineering (China)
Academy of Opto-electronics (China)
Lei Nei, Hubei Univ. of Technology (China)
Key Lab. of Modern Manufacturing Quality Engineering (China)
Da-xing Zhao, Hubei Univ. of Technology (China)
Key Lab. of Modern Manufacturing Quality Engineering (China)
Zhi Xiong, Hubei Univ. of Technology (China)
Key Lab. of Modern Manufacturing Quality Engineering (China)
Academy of Opto-electronics (China)
Lei Nei, Hubei Univ. of Technology (China)
Key Lab. of Modern Manufacturing Quality Engineering (China)
Da-xing Zhao, Hubei Univ. of Technology (China)
Key Lab. of Modern Manufacturing Quality Engineering (China)
Liu-gang Zhang, Hubei Univ. of Technology (China)
Zhi-peng Xia, Hubei Univ. of Technology (China)
Tao Chen, Hubei Univ. of Technology (China)
Key Lab. of Modern Manufacturing Quality Engineering (China)
Zhi-peng Xia, Hubei Univ. of Technology (China)
Tao Chen, Hubei Univ. of Technology (China)
Key Lab. of Modern Manufacturing Quality Engineering (China)
Published in SPIE Proceedings Vol. 11333:
AOPC 2019: Advanced Laser Materials and Laser Technology
Pu Zhou; Jian Zhang; Wenxue Li; Shibin Jiang; Takunori Taira, Editor(s)
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