
Proceedings Paper
Far-field pseudothermal correlation imagingFormat | Member Price | Non-Member Price |
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Paper Abstract
In this paper, a far-field pseudo-thermal correlation imaging system is proposed which is mainly composed of laser, thermal field modulation system, speckle far field emission system and high-sensitivity intensity fluctuation detection system, etc.. Because the correlation imaging system is based on the principle of intensity fluctuation statistical measurement, it needs to be reconstructed after multiple measurements. An image reconstruction algorithm based on compressive sensing is applied in this paper, which makes full use of sparsity constraints to effectively improve the image restoration effect. Finally, the feasibility of the method is verified by actual imaging test. The experimental results show that the proposed system can clearly image the remote target and obtain better recovery images under the same sampling times.
Paper Details
Date Published: 18 December 2019
PDF: 9 pages
Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 113382H (18 December 2019); doi: 10.1117/12.2547628
Published in SPIE Proceedings Vol. 11338:
AOPC 2019: Optical Sensing and Imaging Technology
John E. Greivenkamp; Jun Tanida; Yadong Jiang; HaiMei Gong; Jin Lu; Dong Liu, Editor(s)
PDF: 9 pages
Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 113382H (18 December 2019); doi: 10.1117/12.2547628
Show Author Affiliations
Hui Yu, Huazhong Institute of Electro-Optics (China)
Weichao Du, Huazhong Institute of Electro-Optics (China)
Bo Wang, Huazhong Institute of Electro-Optics (China)
Weichao Du, Huazhong Institute of Electro-Optics (China)
Bo Wang, Huazhong Institute of Electro-Optics (China)
Chensheng Wang, Huazhong Institute of Electro-Optics (China)
Zhijie Zhang, Huazhong Institute of Electro-Optics (China)
Zhijie Zhang, Huazhong Institute of Electro-Optics (China)
Published in SPIE Proceedings Vol. 11338:
AOPC 2019: Optical Sensing and Imaging Technology
John E. Greivenkamp; Jun Tanida; Yadong Jiang; HaiMei Gong; Jin Lu; Dong Liu, Editor(s)
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