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Proceedings Paper

Automatic test system for multiwavelength laser-induced damage threshold measurements
Author(s): Jie Li; Rongsheng Ba; Xinda Zhou; Yinbo Zheng; Lei Ding; Liqun Chai; Huan Ren; Xiaodong Tang
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Paper Abstract

Laser-induced damage threshold is an important parameter to evaluate the performance of the optical components in high power laser systems. An automated test system is presented to measure multiwavelength laser-induced damage threshold. The presented system can be able to operate the 1-on-1 and R-on-1 methodologies at 1064nm, 532nm, and 355nm. Some solutions are presented to improve the measurement efficiency and the reliability. Experimental results are also provided to confirm the capabilities of the proposed test system.

Paper Details

Date Published: 20 December 2019
PDF: 6 pages
Proc. SPIE 11209, Eleventh International Conference on Information Optics and Photonics (CIOP 2019), 112091S (20 December 2019); doi: 10.1117/12.2547608
Show Author Affiliations
Jie Li, China Academy of Engineering Physics (China)
Rongsheng Ba, China Academy of Engineering Physics (China)
Xinda Zhou, China Academy of Engineering Physics (China)
Yinbo Zheng, China Academy of Engineering Physics (China)
Lei Ding, China Academy of Engineering Physics (China)
Liqun Chai, China Academy of Engineering Physics (China)
Huan Ren, China Academy of Engineering Physics (China)
Xiaodong Tang , China Academy of Engineering Physics (China)


Published in SPIE Proceedings Vol. 11209:
Eleventh International Conference on Information Optics and Photonics (CIOP 2019)
Hannan Wang, Editor(s)

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