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Effect of chopped carbon fiber coating film on infrared and millimeter-wave imaging
Author(s): Zhilong Liu; Xuanyu Wang; Weizhao Yao; Wenjie Dong; Gang Bai
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Paper Abstract

With the development of modern photoelectric reconnaissance and precision guidance weapons, infrared/millimeterwave composite reconnaissance guidance technology is more and more widely used, which greatly enhances the anti-jamming capability of photoelectric weapon system, and also puts forward higher requirements for the stealth protection of targets. In order to explore the protective effect of chopped carbon fiber material on the photoelectric stealth of the target, the thin films coated with chopped carbon fiber were prepared, and the experimental platform was constructed by using infrared thermal imager and millimeter-wave linear array imaging system. The effect of different areal density and different layers of chopped carbon fiber film on infrared/millimeter-wave imaging was tested. The results show that the coating of short cut carbon fiber film has obvious attenuation effect on infrared / millimeter-wave imaging. With the increase of the areal density of chopped carbon fiber, the influence of the film on the infrared/millimeter-wave imaging effect is significantly enhanced, the target contour is gradually blurred, and the attenuation of infrared imaging can reach 94% at the areal density of 9 g/m2. At the same time, it also has a good attenuation effect on the millimeter-wave. The effect of multi-layer superposition of chopped carbon fiber film on infrared/millimeter wave imaging is more obvious.

Paper Details

Date Published: 18 December 2019
PDF: 5 pages
Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 113382B (18 December 2019); doi: 10.1117/12.2547566
Show Author Affiliations
Zhilong Liu, Institute of NBC Defense (China)
Xuanyu Wang, Institute of NBC Defense (China)
Weizhao Yao, Institute of NBC Defense (China)
Wenjie Dong, Institute of NBC Defense (China)
Gang Bai, Institute of NBC Defense (China)


Published in SPIE Proceedings Vol. 11338:
AOPC 2019: Optical Sensing and Imaging Technology
John E. Greivenkamp; Jun Tanida; Yadong Jiang; HaiMei Gong; Jin Lu; Dong Liu, Editor(s)

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