Share Email Print

Proceedings Paper

The compensation of deformation measurement in large field of view based on digital speckle pattern interferometry
Author(s): Fengqing Bao; Weijie Chen II; Qihan Zhao III; Shuangle Wu IV; Yonghong Wang
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Digital speckle pattern interferometry (DSPI) is a high-precision measurement method for measuring the surface deformation of an object. Compared with other measurement techniques, it has the advantages of full-field measurement, real-time, non-contact, high precision and high sensitivity, which has made the technology widely concerned by the measurement community since its birth. However, the application calculation of most of the existing digital speckle interference is based on the paraxial and approximate vertical calculations, ignoring the large fluctuation range of the angle between the laser illumination direction and the CCD observation direction. It makes the measurement error of large field of view larger when the size of the object is large . Therefore, when measuring a large field of view, it is necessary to correct the existing measurement formula. This paper proposes a new method for applying digital speckle interference to large field of view measurement. Based on the basic principle of digital speckle interferometry, the corresponding compensation coefficient is obtained through mathematical relationship to compensate the measurement result of large field of view.

Paper Details

Date Published: 13 November 2019
PDF: 6 pages
Proc. SPIE 11343, Ninth International Symposium on Precision Mechanical Measurements, 113430G (13 November 2019); doi: 10.1117/12.2547431
Show Author Affiliations
Fengqing Bao, Hefei Univ. of Technology (China)
Weijie Chen II, Hefei Univ. of Technology (China)
Qihan Zhao III, Hefei Univ. of Technology (China)
Shuangle Wu IV, Hefei Univ. of Technology (China)
Yonghong Wang, Hefei Univ. of Technology (China)

Published in SPIE Proceedings Vol. 11343:
Ninth International Symposium on Precision Mechanical Measurements
Liandong Yu, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?