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Proceedings Paper

Thermoreflectance-based measurements of facet optical absorption in aged high-power diode lasers (Conference Presentation)
Author(s): Aman Kumar Jha; Chen Li; Kevin P. Pipe; Mark T. Crowley; Daniel Fullager; Jason D. Helmrich; Prabhu Thiagarajan; Robert J. Deri; Rebecca B. Swertfeger; Paul O. Leisher

Paper Abstract

Light absorption at the facet of a high power diode laser can lead to severe heating and catastrophic optical damage. In this work, a combination of high resolution thermoreflectance imaging and a detailed heat transport model of the diode chip are used to measure facet absorption in diode lasers. This approach permits a direct measurement of the effectiveness of passivation layers in improving facet robustness and device lifetime. The ability to quantify facet absorption is an essential step toward enabling rapid development of alternative passivation technologies and improving the reliability and maximum output power of diode laser systems.

Paper Details

Date Published: 11 March 2020
Proc. SPIE 11261, Components and Packaging for Laser Systems VI, 112610I (11 March 2020); doi: 10.1117/12.2547344
Show Author Affiliations
Aman Kumar Jha, Univ. of Michigan (United States)
Chen Li, Univ. of Michigan (United States)
Kevin P. Pipe, Univ. of Michigan (United States)
Mark T. Crowley, Lasertel, Inc. (United States)
Daniel Fullager, Lasertel, Inc. (United States)
Jason D. Helmrich, Lasertel, Inc. (United States)
Prabhu Thiagarajan, Lasertel, Inc. (United States)
Robert J. Deri, Lawrence Livermore National Lab. (United States)
Rebecca B. Swertfeger, Lawrence Livermore National Lab. (United States)
Paul O. Leisher, Freedom Photonics, LLC (United States)

Published in SPIE Proceedings Vol. 11261:
Components and Packaging for Laser Systems VI
Alexei L. Glebov; Paul O. Leisher, Editor(s)

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