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Proceedings Paper

Finite element analysis of focus tunable micro-lens based on electric field modulated liquid crystal
Author(s): Xiaolong Li; Mingji Zhang
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Paper Abstract

A focus tunable micro-lens based on electric field-refractive index modulation in Ag nanoparticle doped polymer dispersed liquid crystal is designed and verified based on finite element method. The micro-lens, with diameter and rise of 60 and 20 microns, consists a pair of ring-type electrodes with polymer dispersed liquid crystal sandwiched between them. By adopting the experimental electric field modulated refractive index, a finite element model is developed to investigate the physical coupling mechanism among electric field, refractive index, electromagnetic fields as well as the focus. Results show that non-homogenous refractive index within the lens is modulated due to the enhancement of electric field, and the refractive index has a negative correlation with the electric field strength. It is also found that the focal distance linearly increases within 115~128 μm when excitation voltage changes within 40 ~220 V with sensitivity of 0.09 μm/V. A critical voltage of 40 V, corresponding to gate electric field strength of 1300 kV/m is founded, which may attribute to the refractive difference between the polymer base and liquid crystal. In comparison with mechanical and geometric focus adjustable lens, such electric field tunable focus micro-lens is advanced in rapid response, high reliability and high accuracy, which enable its promising applications in semiconductor lasers, micro-optical devices.

Paper Details

Date Published: 18 December 2019
PDF: 7 pages
Proc. SPIE 11333, AOPC 2019: Advanced Laser Materials and Laser Technology, 1133310 (18 December 2019); doi: 10.1117/12.2547305
Show Author Affiliations
Xiaolong Li, Shenzhen Technology Univ. (China)
Mingji Zhang, Anhui Univ. of Technology (China)

Published in SPIE Proceedings Vol. 11333:
AOPC 2019: Advanced Laser Materials and Laser Technology
Pu Zhou; Jian Zhang; Wenxue Li; Shibin Jiang; Takunori Taira, Editor(s)

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