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Proceedings Paper

A comparative study on the effect of UV-ozone annealing on the optical properties of ZnMgO thin films and nanorods
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Paper Abstract

Zinc magnesium oxide has emerged as a potential candidate for sensing and optoelectronic applications due to its structural advantages over ZnO. However, especially for UV-optoelectronic device applications, suppression of defects bound emissions in thin films and nanorods are a challenging task. In this report, we show comparison of enhancement in near-band emission and suppression in the defects-band emissions in ZnMgO thin film and nanorods using UV-Ozone (UVO) annealing. Thin films were deposited using RF sputter system and hydrothermal route was used to grow nanorods on the rapid thermal annealed ZnMgO seed layer (as-grown) followed by UVO annealing for 10, 30, 50, 70 and 90 min. Field-emission gun scanning electron microscopy confirmed growth of high density nanorods. High-resolution x-ray diffraction pattern exhibited <002> peak for all samples and a gradual increase in grain size. Room temperature photoluminescence (PL) spectra showed highest NBE emission for 10 min in thin films and 50 min for nanorods. Calculated NBE to DBE integrated area ratio increased to 1.2 for 10 min in thin films and 7.8 times for 50 min nanorods sample as compared to respective as-grown samples. Activation energy calculated from NBE integrated area of nanorods temperature-dependent PL confirmed that 50 min annealed sample showed the highest activation energy. Authors would like to acknowledge DST, India and IITBNF.

Paper Details

Date Published: 5 March 2020
PDF: 7 pages
Proc. SPIE 11281, Oxide-based Materials and Devices XI, 1128129 (5 March 2020); doi: 10.1117/12.2547272
Show Author Affiliations
Md Jawaid Alam, Indian Institute of Technology Bombay (India)
Punam Murkute, Univ. Grenoble Alpes, CRNS (France)
Sushama Sushama, Indian Institute of Technology Bombay (India)
Hemant Ghadi, Ohio State Univ. (United States)
Subhananda Chakrabarti, Indian Institute of Technology Bombay (India)

Published in SPIE Proceedings Vol. 11281:
Oxide-based Materials and Devices XI
David J. Rogers; David C. Look; Ferechteh H. Teherani, Editor(s)

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