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Proceedings Paper

Development of high sensitivity quantitative phase microscopy for label-free imaging of nanoscale dynamics
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Paper Abstract

We propose and demonstrate a high sensitivity common-path quantitative phase microscopy (QPM) technique that can be used to detect nanoscale dynamics with millisecond temporal resolution. Our system is based on a transmission-mode diffraction phase microscope that is implemented with a high electron well-depth camera to reduce the phase noise. Our current system can achieve ~0.1 mrad temporal phase sensitivity, which is one order of magnitude better over most current QPM systems. Our system can be potentially used for observing morphological changes of cells and probing subnanometer membrane dynamics with millisecond temporal resolution.

Paper Details

Date Published: 14 February 2020
PDF: 8 pages
Proc. SPIE 11249, Quantitative Phase Imaging VI, 112491W (14 February 2020); doi: 10.1117/12.2547062
Show Author Affiliations
Yujie Nie, The Chinese Univ. of Hong Kong (Hong Kong, China)
Yijin Wang, The Chinese Univ. of Hong Kong (Hong Kong, China)
Renjie Zhou, The Chinese Univ. of Hong Kong (Hong Kong, China)


Published in SPIE Proceedings Vol. 11249:
Quantitative Phase Imaging VI
Yang Liu; Gabriel Popescu; YongKeun Park, Editor(s)

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