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Proceedings Paper

Silicon photonic phase interrogators for on-chip calibration of optical phased arrays
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Paper Abstract

Correcting phase errors is key to building low cost, high performance integrated optical phased arrays for mass-market applications such as automotive lidar. In this work, we present a phase interrogator component for optical phased arrays which enables the phase error to be measured immediately before the output array of optical emitters. A 32-element silicon/silicon nitride optical phased array is realized in a dual layer photonics stack to verify the component performance. Silicon enables high density integration of photonic components and the phase interrogator has a compact design which fits between waveguides with a separation of 2.5 μm. The phase interrogators enable correction of the beam without any measurement or evaluation of the far-field.

Paper Details

Date Published: 25 February 2020
PDF: 7 pages
Proc. SPIE 11283, Integrated Optics: Devices, Materials, and Technologies XXIV, 112830X (25 February 2020); doi: 10.1117/12.2546542
Show Author Affiliations
Jon Øyvind Kjellman, IMEC (Belgium)
Mathias Prost, IMEC (Belgium)
Aleksandrs Marinins, IMEC (Belgium)
Hemant Kumar Tyagi, IMEC (Belgium)
Tangla David Kongnyuy, IMEC (Belgium)
Sarp Kerman, IMEC (Belgium)
Benedetto Troia, IMEC (Belgium)
Bruno Figeys, IMEC (Belgium)
Sarvagya Dwivedi, IMEC (Belgium)
Marcus S. Dahlem, IMEC (Belgium)
Philippe Soussan, IMEC (Belgium)
Xavier Rottenberg, IMEC (Belgium)
Roelof Jansen, IMEC (Belgium)

Published in SPIE Proceedings Vol. 11283:
Integrated Optics: Devices, Materials, and Technologies XXIV
Sonia M. García-Blanco; Pavel Cheben, Editor(s)

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