Share Email Print
cover

Proceedings Paper

A wavelength reference at 1560 nm using a photonic rubidium spectrometer and aluminum nitride microresonator frequency doubler (Conference Presentation)
Author(s): Casey McKenna; Douglas G. Bopp; Zachary L. Newman; Joshua B. Surya; Alexander Yulaev; Daron Westly; Kartik Srinivasan; Vladimir Aksyuk; Hong X. Tang; John E. Kitching; Matthew T. Hummon

Paper Abstract

Wavelength references in the telecom spectrum have applications in communications and dimensional metrology. However, they typically consist of bulk optics and vapor cells. Photonic integration of these components may lead to low cost, portable devices. Here we demonstrate the incorporation of a photonic Rb spectrometer with an AlN microresonator frequency doubler. Light at 1560 nm is coupled onto a chip containing the AlN microresonator frequency doubler. The resulting 780 nm light is sent to the photonic Rb spectrometer, which consists of an apodized grating beam expander and microfabricated MEMS vapor cell. We perform Doppler broadened spectroscopy of the D2 line and demonstrate preliminary laser stabilization to these features.

Paper Details

Date Published: 9 March 2020
PDF
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112963E (9 March 2020); doi: 10.1117/12.2546429
Show Author Affiliations
Casey McKenna, National Institute of Standards and Technology (United States)
Douglas G. Bopp, National Institute of Standards and Technology (United States)
Zachary L. Newman, National Institute of Standards and Technology (United States)
Joshua B. Surya, Yale Univ. (United States)
Alexander Yulaev, National Institute of Standards and Technology (United States)
Daron Westly, National Institute of Standards and Technology (United States)
Kartik Srinivasan, National Institute of Standards and Technology (United States)
Vladimir Aksyuk, National Institute of Standards and Technology (United States)
Hong X. Tang, Yale Univ. (United States)
John E. Kitching, National Institute of Standards and Technology (United States)
Matthew T. Hummon, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 11296:
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
Selim M. Shahriar; Jacob Scheuer, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray