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Proceedings Paper

Custom high-sensitivity CCD and sCMOS detectors for high-harmonic generation, x-ray absorption spectroscopy, soft x-ray microscopy/tomography, and hard x-ray detection
Author(s): Justin Cooper; Adam J. Wise; Thomas Woodward; Antoine Varagnat
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Paper Abstract

Novel and commercially-relevant applications for soft X-Ray (SXR) methods - protein structural characterization, tomography, and chemical detection - are driving a demand for fast and sensitive detectors in the 20 eV to 10 keV range, often with unusual geometries to accommodate placement in beam lines and vacuum chambers. Here we present several novel CCD SXR detector solutions with high quantum efficiency and readout speed, and where the design can be modified to tilt, tile or extend the sensor from the camera body. Each of these implementations have provided quantum efficiencies peaked at 95% in the soft X-Ray regime. These CCDs while providing very high sensitivity are however generally limited to slow readout rates of ~ 1 Hz for the full frame. Scientific CMOS sensor technology can provide much faster frame rates, large field-of-view and lower readnoise floors. Here we also discuss our sCMOS based solutions for indirect hard X-Ray Detection.

Paper Details

Date Published: 3 March 2020
PDF: 8 pages
Proc. SPIE 11276, Optical Components and Materials XVII, 112761L (3 March 2020); doi: 10.1117/12.2546096
Show Author Affiliations
Justin Cooper, Andor Technology Ltd. (United States)
Adam J. Wise, Andor Technology Ltd. (United States)
Thomas Woodward, Andor Technology Ltd. (United Kingdom)
Antoine Varagnat, Andor Technology Ltd. (United Kingdom)


Published in SPIE Proceedings Vol. 11276:
Optical Components and Materials XVII
Shibin Jiang; Michel J. F. Digonnet, Editor(s)

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