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Proceedings Paper

Oxide-enhanced IR hot-carrier-based photo detection in metal thin-film Si junctions (Conference Presentation)
Author(s): Nicholas Gusken; Alberto Lauri; Yi Li; Takayuki Matsui; Anna Regoutz; Brock G. Doiron; Ryan Bower; Andrei P. Mihai; Rupert F. Oulton; Peter K. Petrov; Lesley F. Cohen; Stefan A. Maier

Paper Abstract

This Conference Presentation, "Oxide-enhanced IR hot-carrier-based photo detection in metal thin-film Si junctions" was recorded at Photonics West 2020 held in San Francisco, California, United States.

Paper Details

Date Published: 9 March 2020
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Proc. SPIE 11285, Silicon Photonics XV, 1128514 (9 March 2020); doi: 10.1117/12.2546034
Show Author Affiliations
Nicholas Gusken, Imperial College London (United Kingdom)
Alberto Lauri, Imperial College London (United Kingdom)
Yi Li, Ludwig-Maximilians-Univ. München (Germany)
Takayuki Matsui, Imperial College London (United Kingdom)
Anna Regoutz, Imperial College London (United Kingdom)
Brock G. Doiron, Imperial College London (United Kingdom)
Ryan Bower, Imperial College London (United Kingdom)
Andrei P. Mihai, Imperial College London (United Kingdom)
Rupert F. Oulton, Imperial College London (United Kingdom)
Peter K. Petrov, Imperial College London (United Kingdom)
Lesley F. Cohen, Imperial College London (United Kingdom)
Stefan A. Maier, Ludwig-Maximilians-Univ. München (Germany)


Published in SPIE Proceedings Vol. 11285:
Silicon Photonics XV
Graham T. Reed; Andrew P. Knights, Editor(s)

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